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The impact of high energy ion irradiation upon CO gas sensitivity of nanostructured GaN epilayers

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dc.contributor.author VOLCIUC, O. S.
dc.contributor.author POPA, V.
dc.contributor.author TIGINYANU, I. M.
dc.contributor.author SKURATOV, V. A.
dc.contributor.author CHO, M.
dc.contributor.author PAVLIDIS, D.
dc.date.accessioned 2020-09-17T13:31:05Z
dc.date.available 2020-09-17T13:31:05Z
dc.date.issued 2010
dc.identifier.citation VOLCIUC, O. S., POPA, V., TIGINYANU, I. M. et al. The impact of high energy ion irradiation upon CO gas sensitivity of nanostructured GaN epilayers. In: Surface Engineering and Applied Electrochemistry, 2010, V. 46, pp.535–537 (2010). ISSN 1068-3755. en_US
dc.identifier.issn 1068-3755
dc.identifier.uri https://doi.org/10.3103/S1068375510060013
dc.identifier.uri http://repository.utm.md/handle/5014/9558
dc.description Access full text - https://doi.org/10.3103/S1068375510060013 en_US
dc.description.abstract Photoelectrochemically nanostructured GaN epilayers were found to exhibit good sensitivity towards CO in the temperature range from 180 to 280°C. We show that subjection of nanostructured GaN samples to 166 MeV Xe+23 ion irradiation causes considerable reduction of the gas sensitivity, while post-irradiation rapid thermal annealing results in sensitivity restoration, the effect being dependent upon the dose of irradiation and annealing temperature. A 50% restoration of the relative sensitivity is demonstrated after rapid thermal annealing for 1 min at 800°C in samples irradiated by Xe+23 ions at a dose of 1012 cm−2. The article is published in the original. en_US
dc.language.iso en en_US
dc.publisher Springer Nature Switzerland en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject nanostructured epilayers en_US
dc.subject epilayers en_US
dc.subject gas sensitivity en_US
dc.title The impact of high energy ion irradiation upon CO gas sensitivity of nanostructured GaN epilayers en_US
dc.type Article en_US


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