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Browsing Articole din publicaţii internaţionale by Author "BĂJENESCU, Titu-Marius I."

Browsing Articole din publicaţii internaţionale by Author "BĂJENESCU, Titu-Marius I."

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  • BĂJENESCU, Titu-Marius I. (Electra Publishing House, 2017)
    Smaller, lighter, faster, cheaper are today demands in microelectronics; new technologies stack and interconnect materials and components are utilised to achieve high density, small size, low weight, reduced power, and ...
  • BĂJENESCU, Titu-Marius I. (INCDIE ICPE-CA Romania, 2023)
    Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is ...
  • BĂJENESCU, Titu-Marius I. (INCDIE ICPE-CA Romania, 2024)
    Failure analysis (FA) is the process of determining the cause of failure, collecting, and analysing data, and developing conclusions to eliminate the failure mechanism (FM) causing specific device or system failures. Why ...
  • BĂJENESCU, Titu-Marius I. (Electra Publishing House, 2018)
    Batteries with high specific energy densities increasingly attract attention as potential energy sources for electric vehicles (EV). Lithium-air batteries are the most promising system because of their theoretical specific ...
  • BĂJENESCU, Titu-Marius I. (Electra Publishing House, 2019)
    At the nano scale, the physical, chemical, and biological properties of materials differ in fundamental, valuable ways from the properties of individual atoms, molecules, or bulk matter. The paper presents a short history, ...

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