Study of piezoelectrycity in structures based on nanofibrous ZnO layers and polysilane

Abstract

Zinc oxide films were deposited by method rf magnetron sputtering in a mixed environment of oxygen and argon on two types of substrates, glass and silicon substrates with different orientations, by varying the deposition parameters in order to obtain high-quality ZnO nanostructured layers. An atomic force microscope was used to measure the piezoelectricity in nanofibrous layers and poly [methyl (H) silane]. The interaction between the type of semiconductor /poly[methyl(H)silane] and the applied electric field has proved that thea given structures are piezoelectric materials useful for fabrication of optoelectronic devices.