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Sensing properties of tellurium based thin films to propylamine and carbon oxide

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dc.contributor.author TSIULYANU, D.
dc.contributor.author MARIAN, S.
dc.contributor.author LIESS, H.-D.
dc.date.accessioned 2021-03-18T15:08:13Z
dc.date.available 2021-03-18T15:08:13Z
dc.date.issued 2002
dc.identifier.citation TSIULYANU, D., MARIAN, S., LIESS, H.-D. Sensing properties of tellurium based thin films to propylamine and carbon oxide. In: Sensors and Actuators B: Chemical. 2002, V. 85, N. 3, pp. 232-238. ISSN 0925-4005. en_US
dc.identifier.uri https://doi.org/10.1016/S0925-4005(02)00113-2
dc.identifier.uri http://repository.utm.md/handle/5014/13902
dc.description Access full text - https://doi.org/10.1016/S0925-4005(02)00113-2 en_US
dc.description.abstract The effect of propylamine (C3H7NH2) and carbon oxide on electrical conductivity of tellurium based thin films has been investigated. It is shown that the absorption of the propylamine vapor leads to reversible increase of the resistance of the layer, while the absorption of CO vapor decreases the resistance. The sensitivity as well as the response and recovery time depend on the gas concentration. Comparative characterization of the sensitivity to different gases and discussion are given. en_US
dc.language.iso en en_US
dc.publisher Elsevier en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject gas sensors en_US
dc.subject chalcogenide semiconductors en_US
dc.subject semiconductors en_US
dc.subject propylamine en_US
dc.subject carbon oxide en_US
dc.title Sensing properties of tellurium based thin films to propylamine and carbon oxide en_US
dc.type Article en_US


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