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Formation of gap edges and shift of Fermi level in As2S3 - based glass alloys with addition of germanium

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dc.contributor.author ANDRIESH, A. M.
dc.contributor.author TSIULYANU, D. I.
dc.date.accessioned 2021-01-22T12:00:36Z
dc.date.available 2021-01-22T12:00:36Z
dc.date.issued 1987
dc.identifier.citation ANDRIESH, A. M., TSIULYANU, D. I. Formation of gap edges and shift of Fermi level in As2S3 - based glass alloys with addition of germanium. In: Journal of Non-Crystalline Solids. 1983, V. 97-98, pp. 1135-1138. ISSN 0022-3093. en_US
dc.identifier.uri https://doi.org/10.1016/0022-3093(87)90272-9
dc.identifier.uri http://repository.utm.md/handle/5014/12543
dc.description Access full text - https://doi.org/10.1016/0022-3093(87)90272-9 en_US
dc.description.abstract The gap formation with the composition change is studied on the basis of complex analysis of the experimental results obtained by investigation of optical absorption and conductivity of both As2S3 Ge glassy materials and heterostructures with crystalline silicon as their basis. It is shown that the gap of the above materials narrows with germanium concentration increase due to shifts of the valence band top. The stationary Fermi level shifts in this case relatively both edges of the allowed bands but it appears to be more fastened to the valence band edge. en_US
dc.language.iso en en_US
dc.publisher Elsevier en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject gaps en_US
dc.subject glassy materials en_US
dc.subject crystalline silicon en_US
dc.title Formation of gap edges and shift of Fermi level in As2S3 - based glass alloys with addition of germanium en_US
dc.type Article en_US


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