Interlayer interaction in Mo/Si multilayers

Abstract

Interlayer interaction in Mo/Si superconducting multilayers was determined by two methods involving the measurements of the critical magnetic fields and magnetoresistivity (MR) in a normal state at both parallel and perpendicular H orientations. Data on MR allow one to determine the effective thickness of the metal layer L∗ which characterizes interlayer interaction. On the Mo/Si series with the constant Si layer thickness LSi the oscillations of L∗ are observed which correlate closely with ones of anisotropy parameter γ. The tunnel (Josephson) nature of the interlayer coupling is confirmed by the data obtained on multilayer series with variable LSi. On these samples the correlation between γ and L∗ behavior is also found.