A method of virtual image for determination of negative refraction index of a nanomedium

SERGENTU, V.; URSAKI, V.

dc.contributor.author	SERGENTU, V.
dc.contributor.author	URSAKI, V.
dc.date.accessioned	2020-11-18T12:00:12Z
dc.date.available	2020-11-18T12:00:12Z
dc.date.issued	2017
dc.identifier.citation	SERGENTU, V., URSAKI, V. A method of virtual image for determination of negative refraction index of a nanomedium. In: Romanian Reports in Physics. 2017, V. 69, Nr. of. art. 404. ISSN 12211451, 18418759.	en_US
dc.identifier.uri	http://repository.utm.md/handle/5014/11558
dc.description.abstract	In this paper we propose a method for measuring the negative refraction index of films of optically transparent materials. The method is based on recording the direction of propagation and the shifting of the ray reflected from the film. It is shown that the method can be applied for both macroscopic and nanometric samples. However, a precise control of parameters of the radiation source is needed for using this method in the case of nanometric samples. The conditions for a composite medium to acquire a negative refractive index are discussed.	en_US
dc.language.iso	en	en_US
dc.publisher	Romanian Academy Publishing House	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	optical nanomediums	en_US
dc.subject	nanomediums	en_US
dc.subject	metamaterials	en_US
dc.subject	refraction index	en_US
dc.subject	waves	en_US
dc.subject	optical impedance	en_US
dc.subject	impedance	en_US
dc.title	A method of virtual image for determination of negative refraction index of a nanomedium	en_US
dc.type	Article	en_US