Sharp variations in the temperature dependence of optical reflectivity from AlN/GaN heterostructures

URSAKI, V. V.; TIGINYANU, I. M.; SYRBU, N. N.; ZALAMAI, V. V.; HUBBARD, S.; PAVLIDIS, D.

dc.contributor.author	URSAKI, V. V.
dc.contributor.author	TIGINYANU, I. M.
dc.contributor.author	SYRBU, N. N.
dc.contributor.author	ZALAMAI, V. V.
dc.contributor.author	HUBBARD, S.
dc.contributor.author	PAVLIDIS, D.
dc.date.accessioned	2020-11-17T11:51:37Z
dc.date.available	2020-11-17T11:51:37Z
dc.date.issued	2002
dc.identifier.citation	URSAKI, V. V., TIGINYANU, I. M., SYRBU, N. N. et al. Sharp variations in the temperature dependence of optical reflectivity from AlN/GaN heterostructures. In: Semiconductor Science and Technology, 2002, V. 18, Nr. 2, pp. L9--L11. ISSN 0268-1242 (print), 1361-6641 (web).	en_US
dc.identifier.uri	https://doi.org/10.1088/0268-1242/18/2/101
dc.identifier.uri	http://repository.utm.md/handle/5014/11532
dc.description	Access full text - https://doi.org/10.1088/0268-1242/18/2/101	en_US
dc.description.abstract	Sharp variations in optical reflectivity were observed when cooling and heating AlN/GaN heterostructures on sapphire substrates between room temperature and 10 K. The reflectivity was found to decrease at a definite temperature Tk in the downward temperature run, and to recover at Tr > Tk in the subsequent upward temperature run. The temperature behaviour of reflectivity exhibits memory on the cooling–heating cycles previously subjected to samples.	en_US
dc.language.iso	en	en_US
dc.publisher	IOP Publishing	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	reflectivity	en_US
dc.subject	heterostructures	en_US
dc.title	Sharp variations in the temperature dependence of optical reflectivity from AlN/GaN heterostructures	en_US
dc.type	Article	en_US