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dc.contributor.author KOROTCENKOV, G.
dc.contributor.author RODRÍGUEZ, J.
dc.contributor.author CIRERA, A.
dc.contributor.author CORNET, A.
dc.contributor.author GOLOVANOV, V.
dc.contributor.author LYCHKOVSKY, Yu.
dc.contributor.author KARKOTSKY, G.
dc.contributor.author BORIS, I.
dc.date.accessioned 2019-10-16T10:45:35Z
dc.date.available 2019-10-16T10:45:35Z
dc.date.issued 2005
dc.identifier.citation KOROTCENKOV, G., RODRIGUEZ, J., CIRERA, A. et al. In2O3 structure analysis by Raman spectroscopy. In: Microelectronics and Computer Science: proc. of the 4th intern. conf., September 15-17, 2005. Chişinău, 2005, vol. 1, pp. 52-55. ISBN 9975-66-038-X. en_US
dc.identifier.isbn 9975-66-038-X
dc.identifier.uri http://repository.utm.md/handle/5014/4729
dc.description.abstract The analysis of Raman scattering of doped In2O3 ceramics was carried out and the mechanism of doping influence on In2O3 grain structure was suggested. en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject ceramics doping en_US
dc.subject spectroscopy en_US
dc.subject Raman spectroscopy en_US
dc.title In2O3 structure analysis by Raman spectroscopy en_US
dc.type Article en_US


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