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Browsing Conferinţa "Microelectronics and Computer Science" by Subject "zirconium dioxide thin films"

Browsing Conferinţa "Microelectronics and Computer Science" by Subject "zirconium dioxide thin films"

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  • SHISHIYANU, Sergiu T.; GUEORGUIEV, Valentin K.; YILMAZ, Ercan; TURAN, Rasit; SHISHIYANU, Teodor S. (Technical University of Moldova, 2009)
    The doses of γ –irradiation applied have been up to 80 Gray. The C-V characteristics seeing as the flat-band shift when exposed to γ – irradiation showed high sensitivity. Raman scattering measurements of the undoped ZrO2 ...

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