Browsing Conferinţa "Microelectronics and Computer Science" by Subject "design for testability"

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Complementaritatea funcțiilor logice

COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei (Technical University of Moldova, 2009)

For more than 20 years Design for Testability (DFT) is in a big impasse: the solutions proposed do not represent general methods, well argumented and formalized – they rather present cases of specific structures or particular ...
Functional aspects in the design for testability.

COJOCARU, Ion; EŞANU, Mariana (Tehnica UTM, 2014)

Addressing Design for testability of digital structures requires performing complex studies of phenomena at the frontiers of scientific directions as mathematical logic, physics, chemistry, biology. Half a century passed ...
Omogenitatea – proprietate de bază a circuitelor digitale testabile

COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei (Technical University of Moldova, 2009)

Solving the problem of Design for Testability (DFT) supposes not just studying the modern promising ways, but deep studying of the different traditional aspects connected to synthesis of easy testable digital circuits (DC). ...

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