Aspects of application of the impedance simulators for impedance measurement

NASTAS, Vitalie

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dc.contributor.author	NASTAS, Vitalie
dc.date.accessioned	2024-01-05T09:25:38Z
dc.date.available	2024-01-05T09:25:38Z
dc.date.issued	2009
dc.identifier.citation	NASTAS, Vitalie. Aspects of application of the impedance simulators for impedance measurement. In: Microelectronics and Computer Science: proc. 6th International Conference, 1-3 Oct. 2009, Chişinău, Republica Moldova, vol. 1, 2009, pp. 61-64. ISBN 978-9975-45-045-4. ISBN 978-9975-45-122-2 (vol. 1).	en_US
dc.identifier.isbn	978-9975-45-045-4
dc.identifier.isbn	978-9975-45-122-2
dc.identifier.uri	http://repository.utm.md/handle/5014/25720
dc.description.abstract	The paper relates about some aspects of application of the metrological impedance simulators (MIS) for high precision impedance measurement. The classification of these devices and the most important requirements are presented, also the essential features of MIS are estimated. The diagram of conversion of the information, the block diagram and the basic scheme of the voltage controlled Cartesian coordinates MIS are presented as example of this class of devices.	en_US
dc.language.iso	en	en_US
dc.publisher	Technical University of Moldova	en_US
dc.relation.ispartof	Proceeding of the 6th International Conference on "Microelectronics and Computer Science", oct.1-3, 2009, Chişinău, Moldova
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	metrological impedance simulators	en_US
dc.subject	impedance measurements	en_US
dc.subject	simulated resonance	en_US
dc.title	Aspects of application of the impedance simulators for impedance measurement	en_US
dc.type	Article	en_US