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Aspects of application of the impedance simulators for impedance measurement

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dc.contributor.author NASTAS, Vitalie
dc.date.accessioned 2024-01-05T09:25:38Z
dc.date.available 2024-01-05T09:25:38Z
dc.date.issued 2009
dc.identifier.citation NASTAS, Vitalie. Aspects of application of the impedance simulators for impedance measurement. In: Microelectronics and Computer Science: proc. 6th International Conference, 1-3 Oct. 2009, Chişinău, Republica Moldova, vol. 1, 2009, pp. 61-64. ISBN 978-9975-45-045-4. ISBN 978-9975-45-122-2 (vol. 1). en_US
dc.identifier.isbn 978-9975-45-045-4
dc.identifier.isbn 978-9975-45-122-2
dc.identifier.uri http://repository.utm.md/handle/5014/25720
dc.description.abstract The paper relates about some aspects of application of the metrological impedance simulators (MIS) for high precision impedance measurement. The classification of these devices and the most important requirements are presented, also the essential features of MIS are estimated. The diagram of conversion of the information, the block diagram and the basic scheme of the voltage controlled Cartesian coordinates MIS are presented as example of this class of devices. en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.relation.ispartof Proceeding of the 6th International Conference on "Microelectronics and Computer Science", oct.1-3, 2009, Chişinău, Moldova
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject metrological impedance simulators en_US
dc.subject impedance measurements en_US
dc.subject simulated resonance en_US
dc.title Aspects of application of the impedance simulators for impedance measurement en_US
dc.type Article en_US


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