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The method of measuring the parameters of nanostructured sensors

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dc.contributor.author VERJBITKI, Valeri
dc.contributor.author MARTÎNIUC, Alexei
dc.date.accessioned 2022-12-27T14:19:59Z
dc.date.available 2022-12-27T14:19:59Z
dc.date.issued 2022
dc.identifier.citation VERJBITKI, Valeri, MARTÎNIUC, Alexei. The method of measuring the parameters of nanostructured sensors. In: Electronics, Communications and Computing (IC ECCO-2022): 12th intern. conf., 20-21 Oct. 2022, Chişinău, Republica Moldova: conf. proc., Chişinău, 2022, pp. 94-97. en_US
dc.identifier.uri https://doi.org/10.52326/ic-ecco.2022/EL.06
dc.identifier.uri http://repository.utm.md/handle/5014/21835
dc.description.abstract In this paper, the data obtained from the research on the development of methods for measuring the parameters of nanostructured sensors, which is based on the use of 2 amplifiers and 2 analog-digital converters for measuring the voltages at the reference voltage source and the voltage drop on the additional resistor, which eliminates the shunt effect of the resistance of the structures investigated by the resistance input of the amplifier. en_US
dc.language.iso en en_US
dc.publisher Technical University of Moldova en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject nanostructured sensors en_US
dc.subject reference voltage en_US
dc.subject input impedance en_US
dc.title The method of measuring the parameters of nanostructured sensors en_US
dc.type Article en_US


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  • 2022
    Proceedings of the 12th IC|ECCO; October 20-21, 2022

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Attribution-NonCommercial-NoDerivs 3.0 United States Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States

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