The device and method for measuring the parameters of nanosensors based on semiconductor nanostructured oxides in the range of microwatts

VERJBIŢKI, Valeri; LUPAN, Oleg; RAILEAN, Serghei

Home
→
Colecția instituțională
→
Inventii
→
EUROINVENT
→
2018
→
View Item

dc.contributor.author	VERJBIŢKI, Valeri
dc.contributor.author	LUPAN, Oleg
dc.contributor.author	RAILEAN, Serghei
dc.date.accessioned	2022-05-27T10:09:51Z
dc.date.available	2022-05-27T10:09:51Z
dc.date.issued	2018
dc.identifier.citation	VERJBIŢKI, Valeri, LUPAN, Oleg, RAILEAN, Serghei. The device and method for measuring the parameters of nanosensors based on semiconductor nanostructured oxides in the range of microwatts. In: European Exhibition of Creativity and Innovation: proc. of the 10th ed. EUROINVENT, Iasi, Romania, 2018, p. 188. ISSN 2601-4564. e-ISSN 2601-4572.	en_US
dc.identifier.issn	2601-4564
dc.identifier.issn	2601-4572
dc.identifier.uri	http://repository.utm.md/handle/5014/20453
dc.description	Application s 2017 0139, 2017.12.27. Patent: http://www.db.agepi.md/Inventions/details/s%202017%200139. Exibits Clasification: 1. Environment - Pollution Control.	en_US
dc.description.abstract	The device for measuring the resistance of nanostructure of semiconductor oxide sensors includes an adjustable reference voltage source connected to a series-connected nanostructure Rx and a reference resistance R0, the voltage drop of which is applied to the inputs of the microprocessor's analog-to-digital converters (ADC).	en_US
dc.language	en
dc.publisher	Romanian Inventors Forum	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	invenţii	en_US
dc.subject	inventions	en_US
dc.subject	semiconductor oxide sensors	en_US
dc.subject	nanostructures	en_US
dc.title	The device and method for measuring the parameters of nanosensors based on semiconductor nanostructured oxides in the range of microwatts	en_US
dc.type	Article	en_US