Device and method for measuring the resistance of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts

VERJBIŢKI, Valeri; LUPAN, Oleg; RAILEAN, Serghei

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dc.contributor.author	VERJBIŢKI, Valeri
dc.contributor.author	LUPAN, Oleg
dc.contributor.author	RAILEAN, Serghei
dc.date.accessioned	2022-05-25T07:35:48Z
dc.date.available	2022-05-25T07:35:48Z
dc.date.issued	2020
dc.identifier.citation	VERJBIŢKI, Valeri, LUPAN, Oleg, RAILEAN, Serghei. Device and method for measuring the resistance of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts. In: European Exhibition of Creativity and Innovation: proc. of the 12th ed. EUROINVENT, Iasi, Romania, 2020, p. 165. ISSN 2601-4564. e-ISSN 2601-4572.	en_US
dc.identifier.issn	2601-4564
dc.identifier.issn	2601-4572
dc.identifier.uri	http://repository.utm.md/handle/5014/20399
dc.description	Patent number MD 1269 Z, 2018.07.31. Exibits Clasification: 1. Environment - Pollution Control.	en_US
dc.description.abstract	The device comprises an adjustable reference voltage source connected to the output of a microcontroller and connected in series to the investigated nanostructured sensor and to the reference resistor, the connection point of which to the investigated sensor is connected to the input of the microcontroller. The method consists in: measuring the voltage of the reference voltage source, measuring the voltage drop across the reference resistor, calculating the voltage drop across the investigated nanostructure. Current flowing through the nanostructure and the applied power to the nanostructure are calculated and it is set the value of the reference voltage so that the electrical power will not exceed the maximum permitted value.	en_US
dc.language	en
dc.publisher	Romanian Inventors Forum	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	invenţii	en_US
dc.subject	inventions	en_US
dc.subject	voltage sources	en_US
dc.subject	reference voltage source	en_US
dc.subject	nanostructures	en_US
dc.subject	semiconductor oxides	en_US
dc.subject	sensors	en_US
dc.title	Device and method for measuring the resistance of a sensor based on nanostructured semiconductor oxides in the range of the order of microwatts	en_US
dc.type	Article	en_US