IRTUM – Institutional Repository of the Technical University of Moldova

Browsing Facultatea Calculatoare, Informatică şi Microelectronică by Subject "zirconium dioxide thin films"

Browsing Facultatea Calculatoare, Informatică şi Microelectronică by Subject "zirconium dioxide thin films"

Sort by: Order: Results:

  • SHISHIYANU, Sergiu T.; GUEORGUIEV, Valentin K.; YILMAZ, Ercan; TURAN, Rasit; SHISHIYANU, Teodor S. (Technical University of Moldova, 2009)
    The doses of γ –irradiation applied have been up to 80 Gray. The C-V characteristics seeing as the flat-band shift when exposed to γ – irradiation showed high sensitivity. Raman scattering measurements of the undoped ZrO2 ...

Search DSpace


Browse

My Account