IRTUM – Institutional Repository of the Technical University of Moldova
Phase Transition in Laser Irradiated TiO2 Thin Films
JavaScript is disabled for your browser. Some features of this site may not work without it.
| dc.contributor.author | LUNGU, I. | |
| dc.contributor.author | GHIMPU, L. | |
| dc.contributor.author | POTLOG, T. | |
| dc.contributor.author | MEDVIDS, A. | |
| dc.contributor.author | MOISE, C. | |
| dc.date.accessioned | 2021-11-11T13:12:45Z | |
| dc.date.available | 2021-11-11T13:12:45Z | |
| dc.date.issued | 2021 | |
| dc.identifier.citation | LUNGU, I., GHIMPU, L., POTLOG, T., MEDVIDS, A., MOISE, C. Phase Transition in Laser Irradiated TiO2 Thin Films. In: ICNMBE-2021: the 5th International Conference on Nanotechnologies and Biomedical Engineering, November 3-5, 2021: Program and abstract book. Chişinău, 2021, p. 62. ISBN 978-9975-72-592-7. | en_US |
| dc.identifier.isbn | 978-9975-72-592-7 | |
| dc.identifier.uri | http://repository.utm.md/handle/5014/17971 | |
| dc.description | Only Abstract. | en_US |
| dc.description.abstract | In this study, the laser processing of thermally annealed TiO2 thin films at 420 ℃ in hydrogen atmosphere, utilizing an pulsed fourth-harmonic generation Nd: YAG laser employing different laser intensities in the atmosphere at room temperature, has been reported. Further, the surface morphology and crystalline structure have been investigated by means of atomic force microscopy [AFM], X-ray diffraction [XRD], Raman analysis. The AFM images obtained show that the film’s surface changes as the effect of the laser processes. Moreover, XRD and Raman analysis of the TiO2 thin films indicate at the threshold laser intensity, Ith = 66 MW/cm2 of the fourth-harmonic generation Nd: YAG laser phase transition from atanase-rutile to a crystalline 100% rutile. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Universitatea Tehnică a Moldovei | en_US |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
| dc.subject | TiO2 Thin Films | en_US |
| dc.subject | laser processes | en_US |
| dc.subject | hydrogen atmosphere | en_US |
| dc.title | Phase Transition in Laser Irradiated TiO2 Thin Films | en_US |
| dc.type | Article | en_US |
Files in this item
The following license files are associated with this item:
This item appears in the following Collection(s)
Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States