Browsing by Subject "NEMS"

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  • BĂJENESCU, Titu-Marius I.; BÂZU, Marius I. (Tehnica UTM, 2020)
    The article focuses on the analysis of different nanoelectronic architectures with special design rules, taking into account the reliability of the future product. In the next decade, the reliability will play an even ...
  • SINGH, R.; ALAPATT, G. F.; GUPTA, N.; POOLE, K. F. (Technical University of Moldova, 2011)
    Nanostructures in dimension below about 10 nm show interesting properties because of the effect of low-dimension physics. However, to utilize these properties in practice to commercialize NEMS and related nano-systems ...
  • BĂJENESCU, Titu-Marius I. (Technical University of Moldova, 2021)
    A full understanding of the physics and statistics of the defect generation is required to investigate the ultimate reliability limitations of manufacturability of MEMS and NEMS. In order that the user can include electronic ...

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