Browsing by Author "YILMAZ, Ercan"

Sort by: Order: Results:

  • ERGIN, F. Belgin; TURAN, Raşit; SHISHIYANU, Sergiu T.; YILMAZ, Ercan (Elservier, 2010)
    Radiation effects on Metal Oxide Semiconductor (MOS) capacitors with a HfO2 gate insulator have been studied. Because HfO2 is a promising high-k dielectric material for microelectronic applications, radiation effects on ...
  • SHISHIYANU, Sergiu T.; GUEORGUIEV, Valentin K.; YILMAZ, Ercan; TURAN, Rasit; SHISHIYANU, Teodor S. (Technical University of Moldova, 2009)
    The doses of γ –irradiation applied have been up to 80 Gray. The C-V characteristics seeing as the flat-band shift when exposed to γ – irradiation showed high sensitivity. Raman scattering measurements of the undoped ZrO2 ...

Search DSpace

Browse

My Account