SHISHIYANU, S. T.; SHISHIYANU, T. S.; YILMAZ, E.; TURAN, R.; MOGADDAM, N. A. P.
(Technical University of Moldova, 2011)
Effect of γ – radiation on SiO2(Ge)SiO2/Si nanostructures structural defects was investigated by C-V measurements characterization. The obtained results demonstrated that by low dose γ-radiation (0.1Gy*150Gy) have been ...