LIU, X.; SIDORENKO, A.; WAGNER, S.; ZIEGLER, P.; LÖHNEYSEN von , H.
(American Physical Society, 1996)
The thermoelectric power S and electrical resistivity ρ, measured between 1.5 and 30 K, of just insulating, heavily doped Si show distinct differences between uncompensated and compensated samples. S(T) of Si:P exhibits a ...